We are excited to announce that the xG-ALOE PlugFest, organized in collaboration with the Fraunhofer Heinrich Hertz Institute HHI and EANTC AG, will take place in Berlin from September 29 to October 2.
The event is dedicated to interoperability, accelerating innovation, and fostering collaboration across the O-RAN ecosystem. We look forward to welcoming the industry in Berlin and driving the advancement of open and resilient O-RAN networks.
Over the course of four days, vendors, technology providers, and partners will join forces to validate the latest innovations in O-RAN campus networks. The PlugFest will focus on end-to-end solutions across multiple testing domains:
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O-RAN End-to-End Tests (O-RU, O-DU, O-CU, 5G Core)
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Time-Sensitive Networking (TSN)
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Localization & Sensing
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Security Testing
“Testing next-generation networks means more than measuring throughput: by generating, time-stamping, and analyzing Ethernet frames, we gain clear insights into bandwidth, latency, and jitter across diverse setups. As we integrate or remove components such as LiFi, TSN, and 5G/6G core networks, we can observe in real time how these emerging technologies influence SLA compliance and shape reliable, future-ready connectivity,” explains Gabriele Schrenk, Managing Director of EANTC AG.
Results will be shared on October 28, delivering valuable insights to vendors, system integrators, and end users.